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Okamoto, Yoshihiro; Yaita, Tsuyoshi
Bunseki, 2015(11), p.478 - 485, 2015/11
Utilization of synchrotron radiation based technique in the chemical analysis of environmental samples were reviewed. At first, the environmental samples were defined as follows, (1) elements contained in the samples are unknown, (2) chemical form of the elements are also unknown and (3) distribution of the chemical species are unknown. To elucidate these chemical state information, fluorescence X-ray analysis, fluorescence based XAFS and imaging XAFS technique were introduced by using some examples.
Okamoto, Yoshihiro; Shiwaku, Hideaki
no journal, ,
The chemical correlation between two elements in the material was tried to analyze using extension of the imaging XAFS technique. Since the imaging XAFS spectrum contains information on position in the material, XAFS data corresponding to the specific domain in the material can be selectively obtained in the analysis. In the presentation, this new imaging XAFS analytical technique is introduced together with some examples.